webinar

Join Chris Perkins and Ian Wood, Technical Managers at Rochester Electronics, for a focused session on maintaining supply control across long‑life semiconductor programmes

There’s only one week to go: stabilise long‑life semiconductor programmes before parts go end of life

REGISTER NOW

Manufacturing your way out of semiconductor obsolescence — before disruption hits

Free webinar – Wednesday 25th June, 11am GMT (or sign up for the recording)

With just one week to go, this is your final chance to register for Components in Electronics’ free webinar with Rochester Electronics — and learn how authorised manufacturing provides a reliable route out of component obsolescence.

When critical semiconductors reach end of life, organisations face halted production, costly redesigns, delayed recertification, and grey‑market risk. But obsolescence doesn’t have to mean disruption.

Join Chris Perkins and Ian Wood, Technical Managers at Rochester Electronics, for a focused session on maintaining supply control across long‑life semiconductor programmes through licensed manufacturing, wafer and die banking, assembly, test, and reliability services. A live Q&A will follow.

Discover how manufacturing‑led strategies:

  • extend continuity well beyond original production
  • eliminate unnecessary redesign and recertification costs
  • protect operational stability and brand integrity
  • reduce lifecycle risk across industrial, aerospace, defence, transportation, and medical sectors
  • turn obsolescence from a rising threat into a controlled, long‑term advantage

 Key takeaways:

  • Manufacturing‑led strategies to overcome obsolescence
  • Avoiding redesign, qualification, and recertification costs
  • Eliminating grey‑market and counterfeit exposure
  • Ensuring authorised, long‑term supply continuity
  • Strengthening resilience in critical semiconductor programmes

Secure your place today: https://www.brighttalk.com/webcast/14305/669163?utm_source=brighttalk-portal&utm_medium=web&utm_campaign=channel-feed

For more news please visit: News – CIE